Nanotechnology/Scanning probe microscopy

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Scanning probe microscopy

Scanning probe microscopy covers the methods where a sharp tip is scanned over a surface in a raster pattern and the interaction with the surface is recorded in each pixel to form an image of the interaction. There are a multitude of methods and interactions in SPM. Broadly speaking, there are three main categories:

Overview of the main types of Scanning Probe Microscope types: Scanning Tunneling Microscope (STM) - using the tunneling current I between the outermost atom of a conducting probe within an atomic distance from a substrate to map out the sample topography and electrical properties. Atomic Force Microscope (AFM) - using the van der Waals forces or contact forces between a tip and the sample to measure the sample topography or mechanical properties. Scanning Near-field Optical Microscope (SNOM) - using the scattered light through a sub-wavelength aperture to form an image.

Atomic force microscope (AFM)

Scanning tunneling microscopy (STM)

Scanning Near-field optical microscopy (SNOM)

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